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CHIZURU MATSUI, Hironobu Kawamura

Two principal paradigms dominate in automated defect detection: convolutional neural network (CNN)-based approaches and proprietary non-CNN algorithmic methods. The optimal choice depends on the targe...

The International Journal of Advanced Manufacturing Technology 2026-04-21 rs-9303803
visual inspection anomaly detection image processing MVTec AD multi-filter fusion luminance variance thresholding
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